Showing 1 - 3 results of 3 for search 'Deivasigamani Ravi', query time: 0.02s Refine Results
  1. 1
    Analysis of Anti-JFET for 600V VDMOS and HCI Reliability

    Analysis of Anti-JFET for 600V VDMOS and HCI Reliability by Yang Shao-Ming, Sheu Gene, Lai Chiu-Chung, Deivasigamani Ravi

    Published 2018-01-01
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  2. 2
    120V Low Side LDMOS Device with Sided Isolation of 0.35μm CMOS Compatible Process

    120V Low Side LDMOS Device with Sided Isolation of 0.35μm CMOS Compatible Process by Deivasigamani Ravi, Sheu Gene, Aryadeep Chirag, Sai S. Krishna, Selvendran S., Yang Shao-Ming

    Published 2018-01-01
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  3. 3
    Study of HCI Reliability for PLDMOS

    Study of HCI Reliability for PLDMOS by Deivasigamani Ravi, Sheu Gene, Aanand, Wei Lu Shao, Sarwar Imam Syed, Lai Chiu-Chung, Yang Shao-Ming

    Published 2018-01-01
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