Showing 1 - 6 results of 6 for search 'Despont, M', query time: 0.02s
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1
Nanoscale PtSi Tips for Conducting Probe Technologies by Bhaskaran, H, Sebastian, A, Despont, M
Published 2009Journal article -
2
Encapsulated tips for reliable nanoscale conduction in scanning probe technologies. by Bhaskaran, H, Sebastian, A, Drechsler, U, Despont, M
Published 2009Journal article -
3
Nanoscale phase transformation in Ge2Sb2Te5 using encapsulated scanning probes and retraction force microscopy. by Bhaskaran, H, Sebastian, A, Pauza, A, Pozidis, H, Despont, M
Published 2009Journal article -
4
Novel Scanning Probe Concepts for Nanoscale Electrical Characterization by Sebastian, A, Bhaskaran, H, Pauza, A, Despont, M, Pozidis, H, IEEE
Published 2009Journal article -
5
Note: micro-cantilevers with AlN actuators and PtSi tips for multi-frequency atomic force microscopy. by Sebastian, A, Shamsudhin, N, Rothuizen, H, Drechsler, U, Koelmans, W, Bhaskaran, H, Quenzer, H, Wagner, B, Despont, M
Published 2012Journal article -
6
Ultralow nanoscale wear through atom-by-atom attrition in silicon-containing diamond-like carbon. by Bhaskaran, H, Gotsmann, B, Sebastian, A, Drechsler, U, Lantz, M, Despont, M, Jaroenapibal, P, Carpick, R, Chen, Y, Sridharan, K
Published 2010Journal article