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    On-wafer wideband characterization: a powerful tool for improving the IC technologies

    On-wafer wideband characterization: a powerful tool for improving the IC technologies by Dimitri Lederer, Jean-Pierre Raskin

    Published 2023-06-01
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  2. 2
    Probe-Dependent Residual Error Analysis for Accurate On-Wafer MOSFET Measurements up to 110 GHz

    Probe-Dependent Residual Error Analysis for Accurate On-Wafer MOSFET Measurements up to 110 GHz by Lucas Nyssens, Shiqi Ma, Martin Rack, Dimitri Lederer, Jean-pierre Raskin

    Published 2023-01-01
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    Article

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