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EXPOELECTRONICA ELECTRONICS SHOW – 2023 IN MODERN REALITIES by Dmitry V. Bobrovsky
Published 2023-05-01
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Some aspects of IC radiation hardness evaluation when exposed to neutrons by Alexander I. Chumakov, Armen V. Sogoyan, Dmitry V. Bobrovsky, Dmitry O. Titovets, Konstantin A. Chumakov, Sergey Y. Diankov, Vitaly V. Khaustov, Oleg A. Gerasimchuk, Dmitry I. Yurkov
Published 2021-04-01
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Hardness assurance levels and requirements for single event effects testing of integrated circuits by Alexander I. Chumakov, Armen V. Sogoyan, Anatoly A. Smolin, Alexey O. Ahmetov, Dmitry V. Bobrovsky, Dmitry V. Boychenko, Nikolai V. Ryasnoy, Konstantin A. Chumakov, Evgeny V. Churilin, Vladimir F. Gerasimov, Vitaly V. Khaustov, Alexander A. Sashov, Anastasia V. Ulanova, Andrey V. Yanenko
Published 2020-03-01
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