Filament Formation in TaOx Thin Films for Memristor Device Application: Modeling Electron Energy Loss Spectra and Electron Transport by Jie Jiang, Ruth Pachter, Krishnamurthy Mahalingam, Jim Ciston, Rohan Dhall, Robert J. Bondi, Matthew J. Marinella, Donald A. Telesca, Sabyasachi Ganguli

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