Showing 1 - 20 results of 99 for search 'Duane S. Boning', query time: 0.05s
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1
Mitigation of Thermal Stability Concerns in FinFET Devices by Emmanuel Bender, Joseph B. Bernstein, Duane S. Boning
Published 2022-10-01
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Modern Trends in Microelectronics Packaging Reliability Testing by Emmanuel Bender, Joseph B. Bernstein, Duane S. Boning
Published 2024-03-01
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Efficient IC statistical modeling and extraction using a Bayesian inference framework by Yu, Li, Ph. D. Massachusetts Institute of Technology
Published 2015Other Authors: “…Duane S. Boning and Duane S. Boning.…”
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4
An architecture for flexible distributed experimentation and control with an AME 5000 plasma etcher by Gower, Aaron E. (Aaron Elwood)
Published 2005Other Authors: “…Duane S. Boning.…”
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5
Real-time analysis and control of plasma etching via full wafer interferometry by Wong, Ka Shun
Published 2005Other Authors: “…Duane S. Boning.…”
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6
Design of experiments on a semiconductor plasma ashing process : methods and analysis by Nerurkar, Tanay Rahul
Published 2017Other Authors: “…Duane S. Boning.…”
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7
Control of a semiconductor dry etch process using variation and correlation analyses by Nilgianskul, Tan
Published 2017Other Authors: “…Duane S. Boning.…”
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8
Novel machine learning approaches for modeling variations in semiconductor manufacturing by Chen, Hongge, Ph. D. Massachusetts Institute of Technology
Published 2017Other Authors: “…Duane S. Boning.…”
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9
Dielectric spin coating characterization, modeling, and planarization using fill patterns for advanced packaging technologies by Lang, Christopher Ilic
Published 2018Other Authors: “…Duane S. Boning.…”
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10
Streamlining information and part flow by re-designing process flow to aid root cause analysis by Shabbir, Muhammad Humas
Published 2018Other Authors: “…Duane S. Boning.…”
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11
Redesigning the documentation process to streamline the process flow in the field and improve the overall customer experience by Aiouche, Basma
Published 2018Other Authors: “…Duane S. Boning.…”
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12
Using DMAIC methodology to optimize data processing cycles with an overall goal of improving root cause analysis procedure by Solakoglu, Gokce
Published 2018Other Authors: “…Duane S. Boning.…”
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13
Methods for compact modeling of process variations in silicon photonics devices by Martinez, Germain
Published 2018Other Authors: “…Duane S. Boning.…”
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14
Modeling silicon photonics process variations using ring resonator devices by Moon, Daniel H
Published 2018Other Authors: “…Duane S. Boning.…”
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15
Anomaly detection in semiconductor manufacturing through time series forecasting using neural networks by Chen, Tiankai, M. Eng Massachusetts Institute of Technology
Published 2019Other Authors: “…Duane S. Boning.…”
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16
Applications of reference cycle building and K-shape clustering for anomaly detection in the semiconductor manufacturing process by He, Han, M. Eng Massachusetts Institute of Technology
Published 2019Other Authors: “…Duane S. Boning.…”
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17
Time series data analytics : clustering-based anomaly detection techniques for quality control in semiconductor manufacturing by Makhlouk, Oumaïma
Published 2019Other Authors: “…Duane S. Boning.…”
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18
Adjoint-based particle defect yield modeling by Zhang, Zhengxing(Electrical engineer and computer scientist)Massachusetts Institute of Technology.
Published 2019Other Authors: “…Duane S. Boning.…”
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19
Machine learning for automated anomaly detection in semiconductor manufacturing by DeLaus, Michael Daniel.
Published 2019Other Authors: “…Duane S. Boning.…”
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20
Disentangling time constant and time dependent hidden state in time series with variational Bayesian inference by Grullon, Dylan Emanuel Centeno.
Published 2020Other Authors: “…Duane S. Boning.…”
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