ANALYSIS OF LAW ON LIMITED USE (SERVITUDE) OF A LAND PLOT by E. A. Voronova, I. A. Tedoradze

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ON THE TECHNIQUE OF THE EVALUATION OF THICKNESS DEPENDENCES OF REFRACTIVE INDEX FOR NANOSIZED LIQUID FILMS BY ELLIPSOMETRIC METHOD by N.Yu. Sdobnyakov, N.V. Novozhilov, A.S. Antonov, E.A. Voronova, O.V. Mikhailova

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INVESTIGATION OF THICKNESS DEPENDENCES OF REFRACTIVE INDEX FOR NANOSIZED ACETONE FILM BY ELLIPSOMETRIC METHOD by N.Yu. Sdobnyakov, N.V. Novozhilov, A.S. Antonov, E.A. Voronova, O.V. Mikhailova

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THE MEASUREMENT OF THE CURRENT-VOLTAGE CHARACTERISTICS OF A TUNNEL JUNCTION OF THE TUNGSTEN-GOLD by N.Yu. Sdobnyakov, A.S. Antonov, T.Yu. Zykov, D.N. Sokolov, E.A. Voronova, O.V. Mikhailova

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THE PRODUCTION OF 3-D IMAGES OF THE CHROME NANOCOATING ON THE GLASS SUBSTRATE AND THE MEASUREMENT OF THE CURRENT-VOLTAGE CHARACTERISTICS by A.S. Antonov, T.Yu. Zykov, E.A. Voronova, N.Yu. Sdobnyakov, P.S. Kutilin, A.S. Mikhailov, O.V. Mikhailova

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THE INVESTIGATION OF NANOSIZED SILICON DIOXIDE FILM STRUCTURES BY ELLIPSOMETRIC METHOD by D.A. Kim, N.Yu. Sdobnyakov, D.N. Sokolov, E.A. Voronova, O.V. Mikhailova, T.Yu. Zykov

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THE INVESTIGATION OF THICKNESS DEPENDENCES OF REFRACTIVE INDEX FOR NANOSIZED ETHANOL FILM BY ELLIPSOMETRIC METHOD by D.A. Kim, N.Yu. Sdobnyakov, N.V. Novozhilov, A.S. Antonov, D.N. Sokolov, E.A. Voronova, O.V. Mikhailova

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