Statistical and Electrical Modeling of FDSOI Four-Gate Qubit MOS Devices at Room Temperature by Edoardo Catapano, Gerard Ghibaudo, Mikael Casse, Tadeu Mota Frutuoso, Bruna Cardoso Paz, Thomas Bedecarrats, Agostino Apra, Fred Gaillard, Silvano De Franceschi, Tristan Meunier, Maud Vinet

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