Microwave and Physical Electronics by Brown, F. C., Harrison, G. I., Mutter, W. E., Dillinger, J. R., Eisenstein, A. S., Parke, N. G., Martin, S. T.

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Microwave and Physical Electronics by Harrison, G. I., Mutter, W. E., Henry, J. H., Nottingham, W. B., Dillinger, J. R., Eisenstein, A. S., Brown, F. C., Parke, N. G., Martin, S. T.

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Microwave and Physical Electronics by Hung, C. S., Moats, R. R., Malham, G. W., Henry, J. H., Mutter, W. E., Eisenstein, A. S., Nottingham, W. B., Fineman, A., Zuckerbraun, J., Parke, N. G., Martin, S. T.

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Microwave and Physical Electronics by Sprague, L. E., Moats, R. R., Hung, C. S., Henry, J. H., Mahlman, G. W., Eisenstein, A. S., Nottingham, W. B., Mutter, W. E., Brown, F. C., Jackson, J. D., Chu, L. J., Parke, N. G., Martin, S. T.

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Microwave and Physical Electronics by Mahlman, G. W., Wilkinson, M. K., Wiesner, Jerome B., Henry, J. H., Moats, R. R., Eisenstein, A. S., Mutter, W. E., Sprague, L. E., Hung, C. S., Harris, L. A., Nottingham, W. B., Parke, N. G., Chu, L. J., Dyall, W. T., Marcinkowski, C. J., Jackson, J. D.

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Microwave and Physical Electronics by Eisenstein, A. S., Henry, J. H., Marcinkowski, C. J., Moats, R. R., Rotman, Walter, Nottingham, W. B., Harris, L. A., Hung, C. S., Parke, N. G., Jackson, J. D., Wilkinson, M. K., Martin, S. T., Dyall, W. T., Mayper, V., Jr., Chu, L. J., Wiesner, Jerome B., Eckhardt, D. L., Mutter, W. E., Mahlman, G. W.

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Microwave and Physical Electronics by Parke, N. G., Eisenstein, A. S., Harris, L. A., Mutter, W. E., Rotman, Walter, Jackson, J. D., Dyall, W. T., Sprague, L. E., Moats, R. R., Martin, S. T., Mahlman, G. W., Marcinkowski, C. J., Henry, J. H., Nottingham, W. B., Mayper, V., Jr., Chu, L. J., Mutter, W. E., Hung, C. S., Eckhardt, D. L., Wiesner, Jerome B., Wilkinson, M. K.

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Some properties of the Ba2SiO4 oxide cathode interface

Other Authors: “…Eisenstein, A. S.…”
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An x-ray method for measuring the thickness of thin crystalline films

Other Authors: “…Eisenstein, A. S.…”
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