Bragg diffraction using a 100 ps 17.5 keV x-ray backlighter and the Bragg diffraction imager. by Maddox, B, Park, H, Hawreliak, J, Elsholz, A, Van Maren, R, Remington, B, Comley, A, Wark, J

Strength of shock-loaded single-crystal tantalum [100] determined using in situ broadband x-ray Laue diffraction. by Comley, A, Maddox, B, Rudd, R, Prisbrey, S, Hawreliak, J, Orlikowski, D, Peterson, S, Satcher, J, Elsholz, A, Park, H, Remington, B, Bazin, N, Foster, J, Graham, P, Park, N, Rosen, P, Rothman, SR, Higginbotham, A, Suggit, M, Wark, J

Comley et al. reply. by Comley, A, Maddox, B, Rudd, R, Barton, N, Wehrenberg, C, Prisbrey, S, Hawreliak, J, Orlikowski, D, Peterson, S, Satcher, J, Elsholz, A, Park, H, Remington, B, Bazin, N, Foster, J, Graham, P, Park, N, Rosen, P, Rothman, S, Higginbotham, A, Suggit, M, Wark, J