High resolution deep level transient spectroscopy applied to extended defects in silicon od Evans-Freeman, J, Emiroglu, D, Vernon-Parry, K, Murphy, J, Wilshaw, P

Nitrogen-doped silicon: Mechanical, transport and electrical properties od Murphy, J, Alpass, C, Giannattasio, A, Senkader, S, Emiroglu, D, Evans-Freeman, J, Falster, R, Wilshaw, P