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High resolution deep level transient spectroscopy applied to extended defects in silicon by Evans-Freeman, J, Emiroglu, D, Vernon-Parry, K, Murphy, J, Wilshaw, P
Published 2005Conference item -
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Nitrogen-doped silicon: Mechanical, transport and electrical properties by Murphy, J, Alpass, C, Giannattasio, A, Senkader, S, Emiroglu, D, Evans-Freeman, J, Falster, R, Wilshaw, P
Published 2006Journal article