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Industrial Product Surface Anomaly Detection with Realistic Synthetic Anomalies Based on Defect Map Prediction by Tao Peng, Yu Zheng, Lin Zhao, Enrang Zheng

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Dual Attention-Based Industrial Surface Defect Detection with Consistency Loss by Xuyang Li, Yu Zheng, Bei Chen, Enrang Zheng

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Metal Surface Defect Detection Based on a Transformer with Multi-Scale Mask Feature Fusion by Lin Zhao, Yu Zheng, Tao Peng, Enrang Zheng

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Low-Noise Millimeter-Wave Down-Conversion Technology for Chip-Scaled Optical Clocks by Shuai Li, Lulu Yan, Enrang Zheng, Zhijing Du, Jun Ruan, Shougang Zhang

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