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    Piezoelectric Properties of Pb<sub>1−x</sub>La<sub>x</sub>(Zr<sub>0.52</sub>Ti<sub>0.48</sub>)<sub>1−x/4</sub>O<sub>3</sub> Thin Films Studied by In Situ X-ray Diffraction

    Piezoelectric Properties of Pb<sub>1−x</sub>La<sub>x</sub>(Zr<sub>0.52</sub>Ti<sub>0.48</sub>)<sub>1−x/4</sub>O<sub>3</sub> Thin Films Studied by In Situ X-ray Diffraction by Thomas W. Cornelius, Cristian Mocuta, Stéphanie Escoubas, Luiz R. M. Lima, Eudes B. Araújo, Andrei L. Kholkin, Olivier Thomas

    Published 2020-07-01
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