Showing 1 - 9 results of 9 for search 'Eugenijus Gaubas', query time: 0.03s Refine Results
  1. 1
    Currents Induced by Injected Charge in Junction Detectors

    Currents Induced by Injected Charge in Junction Detectors by Vidas Kalesinskas, Tomas Ceponis, Eugenijus Gaubas

    Published 2013-09-01
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  2. 2
    Profiling of Current Transients in Capacitor Type Diamond Sensors

    Profiling of Current Transients in Capacitor Type Diamond Sensors by Eugenijus Gaubas, Tomas Ceponis, Dovile Meskauskaite, Nikolai Kazuchits

    Published 2015-06-01
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  3. 3
    5.5 MeV Electron Irradiation-Induced Transformation of Minority Carrier Traps in <i>p</i>-Type Si and Si<sub>1−x</sub>Ge<sub>x</sub> Alloys

    5.5 MeV Electron Irradiation-Induced Transformation of Minority Carrier Traps in <i>p</i>-Type Si and Si<sub>1−x</sub>Ge<sub>x</sub> Alloys by Jevgenij Pavlov, Tomas Ceponis, Kornelijus Pukas, Leonid Makarenko, Eugenijus Gaubas

    Published 2022-03-01
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  4. 4
    Simulations of Operation Dynamics of Different Type GaN Particle Sensors

    Simulations of Operation Dynamics of Different Type GaN Particle Sensors by Eugenijus Gaubas, Tomas Ceponis, Vidas Kalesinskas, Jevgenij Pavlov, Juozas Vysniauskas

    Published 2015-03-01
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  5. 5
    Spectroscopy of Technological Defects in Si Solar Cells by Analysis of Temperature Dependent Generation Currents

    Spectroscopy of Technological Defects in Si Solar Cells by Analysis of Temperature Dependent Generation Currents by Jevgenij PAVLOV, Darius BAJARŪNAS, Tomas ČEPONIS, Eugenijus GAUBAS, Dovilė MEŠKAUSKAITĖ

    Published 2014-09-01
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  6. 6
    Luminescence Characteristics of the MOCVD GaN Structures with Chemically Etched Surfaces

    Luminescence Characteristics of the MOCVD GaN Structures with Chemically Etched Surfaces by Tomas Ceponis, Jevgenij Pavlov, Arunas Kadys, Augustas Vaitkevicius, Eugenijus Gaubas

    Published 2023-04-01
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  7. 7
    Study of Radiation-Induced Defects in <i>p</i>-Type Si<sub>1−x</sub>Ge<sub>x</sub> Diodes before and after Annealing

    Study of Radiation-Induced Defects in <i>p</i>-Type Si<sub>1−x</sub>Ge<sub>x</sub> Diodes before and after Annealing by Tomas Ceponis, Stanislau Lastovskii, Leonid Makarenko, Jevgenij Pavlov, Kornelijus Pukas, Eugenijus Gaubas

    Published 2020-12-01
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  8. 8
    Transient Electrical and Optical Characteristics of Electron and Proton Irradiated SiGe Detectors

    Transient Electrical and Optical Characteristics of Electron and Proton Irradiated SiGe Detectors by Tomas Ceponis, Laimonas Deveikis, Stanislau Lastovskii, Leonid Makarenko, Jevgenij Pavlov, Kornelijus Pukas, Vytautas Rumbauskas, Eugenijus Gaubas

    Published 2020-12-01
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  9. 9
    Evolution of Scintillation and Electrical Characteristics of AlGaN Double-Response Sensors During Proton Irradiation

    Evolution of Scintillation and Electrical Characteristics of AlGaN Double-Response Sensors During Proton Irradiation by Tomas Ceponis, Kazimieras Badokas, Laimonas Deveikis, Jevgenij Pavlov, Vytautas Rumbauskas, Vitalij Kovalevskij, Sandra Stanionyte, Gintautas Tamulaitis, Eugenijus Gaubas

    Published 2019-08-01
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