Showing 1 - 3 results of 3 for search 'Evgeniy V. Ubyivovk', query time: 0.02s Refine Results
  1. 1
    Soft x-ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO2(Ti)/SiO2/Si stacks

    Soft x-ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO2(Ti)/SiO2/Si stacks by Elena O Filatova, Igor V Kozhevnikov, Andrey A Sokolov, Evgeniy V Ubyivovk, Sergey Yulin, Mihaela Gorgoi and Franz Schäfers

    Published 2012-01-01
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    Article
  2. 2
    Low-Temperature In-Induced Holes Formation in Native-SiO<sub>x</sub>/Si(111) Substrates for Self-Catalyzed MBE Growth of GaAs Nanowires

    Low-Temperature In-Induced Holes Formation in Native-SiO<sub>x</sub>/Si(111) Substrates for Self-Catalyzed MBE Growth of GaAs Nanowires by Rodion R. Reznik, Konstantin P. Kotlyar, Vladislav O. Gridchin, Evgeniy V. Ubyivovk, Vladimir V. Federov, Artem I. Khrebtov, Dmitrii S. Shevchuk, George E. Cirlin

    Published 2020-08-01
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    Article
  3. 3
    Dopant-stimulated growth of GaN nanotube-like nanostructures on Si(111) by molecular beam epitaxy

    Dopant-stimulated growth of GaN nanotube-like nanostructures on Si(111) by molecular beam epitaxy by Alexey D. Bolshakov, Alexey M. Mozharov, Georgiy A. Sapunov, Igor V. Shtrom, Nickolay V. Sibirev, Vladimir V. Fedorov, Evgeniy V. Ubyivovk, Maria Tchernycheva, George E. Cirlin, Ivan S. Mukhin

    Published 2018-01-01
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    Article

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