Failure Rate Measurement on Silicon Diodes Reverse Polarized at High Temperature by Osorno D., Sanchis-Kilders E., Maset E., Gilabert D., Ferreres A., Jordán J., Esteve V., Gasent-Blesa J.L.

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Benefits and Drawbacks of A High Frequency Gan Zvzcps Converter by Blanes J. M., Garrigós A., Gutierrez R., Carrasco J. A., Maset E., Ejea J.B, Sanchis-Kilders E., Ferreres A., Lizán J. L.

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