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    Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers

    Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers by Hendrik P. Nel, Fortunato Carlos Dualibe, Tinus Stander

    Published 2023-01-01
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