Showing 1 - 1 results of 1 for search 'Fortunier, R', query time: 0.02s
Refine Results
-
1
Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns. by Britton, T, Maurice, C, Fortunier, R, Driver, J, Day, A, Meaden, G, Dingley, D, Mingard, K, Wilkinson, A
Published 2010Journal article