Aberration characterization of x-ray optics using multi-modal ptychography and a partially coherent source by Moxham, TEJ, Laundy, D, Dhamgaye, V, Fox, OJL, Sawhney, K, Korsunsky, AM

Two-dimensional wavefront characterization of adaptable corrective optics and Kirkpatrick-Baez mirror system using ptychography by Moxham, TEJ, Dhamgaye, V, Laundy, D, Fox, OJL, Khosroabadi, H, Sawhney, K, Korsunsky, AM

Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source by Moxham, TEJ, Parsons, A, Zhou, T, Alianelli, L, Wang, H, Laundy, D, Dhamgaye, V, Fox, OJL, Sawhney, K, Korsunsky, AM