Simultaneous On-State Voltage and Bond-Wire Resistance Monitoring of Silicon Carbide MOSFETs by Nick Baker, Haoze Luo, Francesco Iannuzzo

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Two Decades of Condition Monitoring Methods for Power Devices by Giovanni Susinni, Santi Agatino Rizzo, Francesco Iannuzzo

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Ensuring a Reliable Operation of Two-Level IGBT-Based Power Converters: A Review of Monitoring and Fault-Tolerant Approaches by Keting Hu, Zhigang Liu, Yongheng Yang, Francesco Iannuzzo, Frede Blaabjerg

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Thermal Mapping of Power Semiconductors in H-Bridge Circuit by Dao Zhou, Yingzhou Peng, Francesco Iannuzzo, Michael Hartmann, Frede Blaabjerg

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Evaluation of the Thermal Resistance in GaN HEMTs Using Thermo-Sensitive Electrical Parameters by Adrian Valeriu Pirosca, Marcello Vecchio, Santi Agatino Rizzo, Francesco Iannuzzo

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Lifetime analysis of two commercial PV converters using multi-year degradation modelling by Martin Bendix Fogsgaard, Yi Zhang, Amir Sajjad Bahman, Francesco Iannuzzo, Frede Blaabjerg

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Improved Temperature Monitoring and Protection Method of Three-Level NPC Application Based on Half-Bridge IGBT Modules by Qiang Wang, Jingwei Zhang, Francesco Iannuzzo, Amir Sajjad Bahman, Weifeng Zhang, Fengyou He

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A 3D Thermal Network Model for Monitoring Imbalanced Thermal Distribution of Press-Pack IGBT Modules in MMC-HVDC Applications by Yao Chang, Wuhua Li, Haoze Luo, Xiangning He, Francesco Iannuzzo, Frede Blaabjerg, Weixing Lin

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Effect of Current Distortion and Unbalanced Loads on Semiconductors Reliability by Tomas Lledo-Ponsati, Amir Sajjad Bahman, Francesco Iannuzzo, Daniel Montesinos-Miracle, Samuel Galceran-Arellano

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