Hideo Fujiwara

is a Japanese computer scientist who made significant contributions to ATPG (automatic test pattern generation) algorithms. As one of his works, he invented the FAN algorithm in 1983, which was the fastest ATPG algorithm at that time, and was adopted by industry.

He was born in Nara, Japan, and studied electronic engineering at Osaka University, where he received his B.E. degree in 1969, M.E. in 1971, and Ph.D. in 1974. He was with Osaka University from 1974 to 1985, Meiji University from 1985 to 1993, Nara Institute of Science and Technology (NAIST) from 1993 to 2011, and Osaka Gakuin University from 2011 to 2021. Presently, he is Professor Emeritus of NAIST. Provided by Wikipedia
Showing 1 - 6 results of 6 for search 'Fujiwara, Hideo', query time: 0.02s Refine Results
  1. 1
    A new design-for-testability method based on thru-testability

    A new design-for-testability method based on thru-testability by Ooi, Chia Yee, Fujiwara, Hideo

    Published 2011
    Article
  2. 2
    A new class of sequential circuits with acyclic test generation complexity

    A new class of sequential circuits with acyclic test generation complexity by Ooi, Chia Yee, Fujiwara, Hideo

    Published 2006
    Conference or Workshop Item
  3. 3
    A new scan design technique based on pre-synthesis thru functions

    A new scan design technique based on pre-synthesis thru functions by Chia, Yee Ooi, Fujiwara, Hideo

    Published 2006
    Book Section
  4. 4
    A nonscan design-for-testability method for register-transfer-level circuits to guarantee linear-depth time expansion models

    A nonscan design-for-testability method for register-transfer-level circuits to guarantee linear-depth time expansion models by Fujiwara, Hideo, Iwata, Hiroyuki, Yoneda, Tomokazu, Ooi, Chia Yee

    Published 2008
    Article
  5. 5
    An extended class of acyclically testable circuits

    An extended class of acyclically testable circuits by Oka, Nobuyo, Chia, Yee Ooi, Ichihara, Hideyuki, Inoue, Tomoo, Fujiwara, Hideo

    Published 2007
    Conference or Workshop Item
  6. 6
    A new class of easily testable assignment decision diagrams

    A new class of easily testable assignment decision diagrams by Paraman, Norlina, Ooi, Chia Yee, Sha'ameri, Ahmad Zuri, Fujiwara, Hideo

    Published 2010
    Article

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