Showing 1 - 3 results of 3 for search 'Gadlage, Matthew J.', query time: 0.02s Refine Results
  1. 1
    Heavy-ion-induced digital single event transients in a 180 nm fully depleted SOI process

    Heavy-ion-induced digital single event transients in a 180 nm fully depleted SOI process by Gouker, Pascale M., Gadlage, Matthew J., Bhuva, Bharat L., Narasimham, Balaji, Schrimpf, Ronald D.

    Published 2010
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  2. 2
    Effects of Ionizing Radiation on Digital Single Event Transients in a 180-nm Fully Depleted SOI Process

    Effects of Ionizing Radiation on Digital Single Event Transients in a 180-nm Fully Depleted SOI Process by Keast, Craig L., Wyatt, Peter W., Gouker, Pascale M., Gadlage, Matthew J., Narasimham, Balaji, Bhuva, Bharat L., Hughes, Harold, McMarr, Patrick, McMorrow, Dale

    Published 2010
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    Article
  3. 3
    Temperature Dependence of Digital Single-Event Transients in Bulk and Fully-Depleted SOI Technologies

    Temperature Dependence of Digital Single-Event Transients in Bulk and Fully-Depleted SOI Technologies by Gouker, Pascale M., Gadlage, Matthew J., Ahlbin, Jonathan R., Ramachandra, Vishwanath, Dinkin, Cody A., Bhuva, Bharat L., Narasimham, Balaji, Schrimpf, Ronald D., McCurdy, Michael W., Alles, Michael L., Reed, Robert A., Mendenhall, Marcus H., Massengill, Lloyd W., Shuler, Robert L., McMorrow, Dale

    Published 2010
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    Article

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