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    Evaluation of the Long-Term Reliability of Open-Tube Diffused Planar InGaAs/InP Avalanche Photodiodes under a Hybrid of Thermal and Electrical Stresses

    Evaluation of the Long-Term Reliability of Open-Tube Diffused Planar InGaAs/InP Avalanche Photodiodes under a Hybrid of Thermal and Electrical Stresses by Hyejeong Choi, Chan-Yong Park, Soo-Hyun Baek, Gap Yeal Moon, Ilgu Yun

    Published 2022-03-01
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