An automated and unbiased grain segmentation method based on directional reflectance microscopy by Wittwer, Mallory, Gaskey, Bernard, Seita, Matteo

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Optical characterization of grain orientation in crystalline materials by Gaskey, Bernard, Hendl, Ludwig, Wang, Xiaogang, Seita, Matteo

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Measuring crystal orientation from etched surfaces via directional reflectance microscopy by Wang, Xiaogang, Gao, Shubo, Jain, Ekta, Gaskey, Bernard, Seita, Matteo

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Multiscale microstructural heterogeneity and mechanical property scatter in Inconel 718 produced by directed energy deposition by Yeoh, Yong Chen, Macchi. Guido, Jain, Ekta, Gaskey, Bernard, Raman, Sudharshan, Tay, Grace, Verdi, Davide, Patran, Alin, Grande, Antonio Mattia, Seita, Matteo

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