Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy by Thomas König, Georg H. Simon, Lars Heinke, Leonid Lichtenstein, Markus Heyde

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Atomic imprinting in the absence of an intrinsic length scale by Chao Zhou, Amit Datye, Zheng Chen, Georg H. Simon, Xinzhe Wang, Jan Schroers, Udo D. Schwarz

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Revealing surface-state transport in ultrathin topological crystalline insulator SnTe films by Ke Zou, Stephen D. Albright, Omur E. Dagdeviren, M. D. Morales-Acosta, Georg H. Simon, Chao Zhou, Subhasish Mandal, Sohrab Ismail-Beigi, Udo D. Schwarz, Eric I. Altman, Frederick J. Walker, Charles H. Ahn

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