Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters by Joshua W. Pinder, George H. Major, Donald R. Baer, Jeff Terry, James E. Whitten, Jan Čechal, Jacob D. Crossman, Alvaro J. Lizarbe, Samira Jafari, Christopher D. Easton, Jonas Baltrusaitis, Matthijs A. van Spronsen, Matthew R. Linford

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