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    Influence of Bulk Doping and Halos on the TID Response of I/O and Core 150 nm nMOSFETs

    Influence of Bulk Doping and Halos on the TID Response of I/O and Core 150 nm nMOSFETs by Stefano Bonaldo, Serena Mattiazzo, Marta Bagatin, Alessandro Paccagnella, Giovanni Margutti, Simone Gerardin

    Published 2023-01-01
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