Showing 1 - 4 results of 4 for search 'Glasko, J', query time: 0.03s
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Strain and defect microstructure in ion-irradiated GeSi/Si strained layers as a function of annealing temperature by Glasko, J, Elliman, R, Zou, J, Cockayne, D, Gerald, F
Published 1998Journal article -
2
The effect of irradiation temperature on post-irradiation strain levels in GexSi1-x/Si strained layer heterostructures by Glasko, J, Zou, J, Cockayne, D, Gerald, J, Elliman, R
Published 1996Conference item -
3
Ion irradiation of GeSi Si strained-layer heterostructures by Glasko, J, Elliman, R, Zou, J, Cockayne, D, FitzGerald, J
Published 1999Conference item -
4
The effect of ion-implantation induced defects on strain relaxation in GexSi1-x/Si heterostructures by Glasko, J, Zou, J, Cockayne, D, Gerald, J, Kringhoj, P, Elliman, R
Published 1997Conference item