Patterning of sub-1 nm dangling-bond lines with atomic precision alignment on H:Si(100) surface at room temperature by Chen, S., Xu, H., Goh, K. E. J., Liu, Lerwen., Randall, J. N.

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Subthreshold characteristics of ballistic electron emission spectra by Qin, H. L., Goh, K. E. J., Bosman, Michel, Pey, Kin Leong, Troadec, C.

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The electronic barrier height of silicon native oxides at different oxidation stages by Qin, H. L., Goh, K. E. J., Troadec, C., Bosman, Michel, Pey, Kin Leong

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Temperature-dependent relaxation current on single and dual layer Pt metal nanocrystal-based Al2O3/SiO2 gate stack by Pey, Kin Leong, Mahapatra, S., Chen, Y. N., Goh, K. E. J., Wu, X., Lwin, Z. Z., Singh, P. K.

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