Reduced density function analysis using convergent electron illumination and iterative blind deconvolution by McBride, W, Cockayne, D, Goringe, C

Statistical analysis of adsorbates by Mayne, A, Goringe, C, Smith, C, Briggs, G

Convergent beam and 2 dimensional energy filtered RDF analysis by McBride, W, Cockayne, D, McCulloch, D, Goringe, C

IDENTIFICATION OF THE SI(001) MISSING DIMER DEFECT STRUCTURE BY LOW-BIAS VOLTAGE STM AND LDA MODELING by Owen, J, Bowler, D, Goringe, C, Miki, K, Briggs, G

An experimental-theoretical study of the behaviour of hydrogen on the Si(001) surface by Bowler, DR, Owen, J, Goringe, C, Miki, K, Briggs, G

Hydrogen diffusion on Si(001) by Owen, J, Bowler, DR, Goringe, C, Miki, K, Briggs, G

A proposed structure of the nucleus for gas-source epitaxial growth of silicon by Owen, J, Bowler, DR, Goringe, C, Miki, K, Briggs, G

Gas-source growth of group IV semiconductors: II. Growth regimes and the effect of hydrogen by Owen, J, Miki, K, Bowler, DR, Goringe, C, Goldfarb, I, Briggs, G

Gas-source growth of group IV semiconductors: I. Si(001) nucleation mechanisms by Owen, J, Miki, K, Bowler, DR, Goringe, C, Goldfarb, I, Briggs, G

Characterization of Amorphous Materials by Electron Diffraction and Atomistic Modeling. by Cockayne, D, McKenzie, DR, McBride, W, Goringe, C, McCulloch, D

Refinement of amorphous and polycrystalline structures of thin disordered films using energy selected electron diffraction by Cockayne, D, McCulloch, D, McKenzie, DR, Goringe, C, McBride, W

Experimental and theoretical characterization of structure in thin disordered films. by McCulloch, D, McKenzie, DR, Goringe, C, Cockayne, D, McBride, W, Green, D

ADSORPTION OF TRIMETHYLGALLIUM ON SEMICONDUCTOR SURFACES - STM OBSERVATIONS by Mayne, A, Schweitzer, M, Avery, A, Jones, T, Smith, C, Goringe, C, Pethica, J, Briggs, G

In situ observation of gas-source molecular beam epitaxy of silicon and germanium on Si(001) by Goldfarb, I, Owen, J, Bowler, DR, Goringe, C, Hayden, P, Miki, K, Pettifor, D, Briggs, G