Atomistic simulation study of high-κ oxide defects for understanding gate stack and RRAM reliability by Gu, Chenjie

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Fault Transient Analysis and Protection Performance Evaluation within a Large-scale PV Power Plant by Wen Jinghua, Luo Meiling, Gu Chenjie, Wei Hongsheng, Liu Bohan

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The role of the disordered HfO2 network in the high- κ n-MOSFET shallow electron trapping by Gu, Chenjie, Zhou, Canliang, Ang, Diing Shenp, Ju, Xin, Gu, Renyuan, Duan, Tianli

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A vacancy-interstitial defect pair model for positive-bias temperature stress-induced electron trapping transformation in the high-κ gate n-MOSFET by Gu, Chenjie, Ang, Diing Shenp, Gao, Yuan, Gu, Renyuan, Zhao, Ziqi, Zhu, Chao

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A novel fabrication technique for three-dimensional concave nanolens arrays by Duan, Tianli, Xu, Kang, Liu, Zhihong, Gu, Chenjie, Pan, Jisheng, Ang, Diing Shenp, Zhang, Rui, Wang, Yao, Ma, Xuhang

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