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Refractive Indices of Ge and Si at Temperatures between 4–296 K in the 4–8 THz Region by Mira Naftaly, Steve Chick, Guy Matmon, Ben Murdin
Published 2021-01-01
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Non‐Destructive X‐Ray Imaging of Patterned Delta‐Layer Devices in Silicon by Nicolò D'Anna, Dario Ferreira Sanchez, Guy Matmon, Jamie Bragg, Procopios C. Constantinou, Taylor J.Z. Stock, Sarah Fearn, Steven R. Schofield, Neil J. Curson, Marek Bartkowiak, Y. Soh, Daniel Grolimund, Simon Gerber, Gabriel Aeppli
Published 2023-05-01
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