Showing 1 - 7 results of 7 for search 'Gyeongyeop Lee', query time: 0.03s Refine Results
  1. 1
    Overhang Saddle Fin Sidewall Structure for Highly Reliable DRAM Operation

    Overhang Saddle Fin Sidewall Structure for Highly Reliable DRAM Operation by Jin-Woo Han, Minki Suh, Gyeongyeop Lee, Jungsik Kim

    Published 2023-01-01
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  2. 2
    Performance Degradation in Static Random Access Memory of 10 nm Node FinFET Owing to Displacement Defects

    Performance Degradation in Static Random Access Memory of 10 nm Node FinFET Owing to Displacement Defects by Minji Bang, Jonghyeon Ha, Gyeongyeop Lee, Minki Suh, Jungsik Kim

    Published 2023-05-01
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  3. 3
    On-State Current Degradation Owing to Displacement Defect by Terrestrial Cosmic Rays in Nanosheet FET

    On-State Current Degradation Owing to Displacement Defect by Terrestrial Cosmic Rays in Nanosheet FET by Jonghyeon Ha, Gyeongyeop Lee, Hagyoul Bae, Kihyun Kim, Jin-Woo Han, Jungsik Kim

    Published 2022-08-01
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  4. 4
    Investigation Into the Degradation of DDR4 DRAM Owing to Total Ionizing Dose Effects

    Investigation Into the Degradation of DDR4 DRAM Owing to Total Ionizing Dose Effects by Gyeongyeop Lee, Minki Suh, Minsang Ryu, Yunjong Lee, Jin-Woo Han, Jungsik Kim

    Published 2023-01-01
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  5. 5
    Impact of Displacement Defect Owing to Cosmic Rays on Three-Nanometer-Node Nanosheet FET 6T Static Random Access Memory

    Impact of Displacement Defect Owing to Cosmic Rays on Three-Nanometer-Node Nanosheet FET 6T Static Random Access Memory by Jonghyeon Ha, Minji Bang, Gyeongyeop Lee, Minki Suh, Chong-Eun Kim, Jungsik Kim

    Published 2023-01-01
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  6. 6
    Influence of Radiation-Induced Displacement Defect in 1.2 kV SiC Metal-Oxide-Semiconductor Field-Effect Transistors

    Influence of Radiation-Induced Displacement Defect in 1.2 kV SiC Metal-Oxide-Semiconductor Field-Effect Transistors by Gyeongyeop Lee, Jonghyeon Ha, Kihyun Kim, Hagyoul Bae, Chong-Eun Kim, Jungsik Kim

    Published 2022-06-01
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  7. 7
    Prediction of Statistical Distribution on Nanosheet FET by Geometrical Variability Using Various Machine Learning Models

    Prediction of Statistical Distribution on Nanosheet FET by Geometrical Variability Using Various Machine Learning Models by Jonghyeon Ha, Sun Jin Kim, Minji Bang, Gyeongyeop Lee, Minki Suh, Minseob Shim, Chong-Eun Kim, Jungsik Kim

    Published 2023-01-01
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