An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focused ion beam by Halpin, J, Webster, R, Gardner, H, Moody, M, Bagot, P, MacLaren, D

Atom probe tomography of a cu-doped TiNiSn thermoelectric material: nanoscale structure and optimisation of analysis conditions by Henry, H, Halpin, J, Popuri, S, Daly, L, Bos, J-W, Moody, M, MacLaren, D, Bagot, PAG