Unravelling the silicon-silicon dioxide interface under different operating conditions -н Nie, S, Bonilla, RS, Hameiri, Z

Recombination in passivating contacts: investigation into the impact of the contact work function on the obtained passivation -н Le, AHT, Bonilla, RS, Black, LE, Seif, JP, Allen, TG, Dumbrell, R, Samundsett, C, Hameiri, Z

Boron-Oxygen Defect Formation Rates and Activity at Elevated Temperatures -н Hamer, P, Nampalli, N, Hameiri, Z, Kim, M, Chen, D, Gorman, N, Hallam, B, Abbott, M, Wenham, S

Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime -н Blum, A, Swirhun, J, Sinton, R, Yan, F, Herasimenka, S, Roth, T, Lauer, K, Haunschild, J, Lim, B, Bothe, K, Hameiri, Z, Seipel, B, Xiong, R, Dhamrin, M, Murphy, J