Updated Strategy and Scope of Metrology by Han Haitjema

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The Calibration of Displacement Sensors by Han Haitjema

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Calibration of Displacement Laser Interferometer Systems for Industrial Metrology by Han Haitjema

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Digital Twin of an Optical Measurement System by Michiel Vlaeyen, Han Haitjema, Wim Dewulf

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Uncertainty-Based Autonomous Path Planning for Laser Line Scanners by Michiel Vlaeyen, Han Haitjema, Wim Dewulf

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Description and validation of a circular padding method for linear roughness measurements of short data lengths by Stijn Schoeters, Wim Dewulf, Jean-Pierre Kruth, Han Haitjema, Bart Boeckmans

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Viewpoint Planning for Range Sensors Using Feature Cluster Constrained Spaces for Robot Vision Systems by Alejandro Magaña, Michiel Vlaeyen, Han Haitjema, Philipp Bauer, Benedikt Schmucker, Gunther Reinhart

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Optimisation of Imaging Confocal Microscopy for Topography Measurements of Metal Additive Surfaces by Lewis Newton, Aditi Thanki, Carlos Bermudez, Roger Artigas, Adam Thompson, Han Haitjema, Richard Leach

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