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Back-to-Basics tutorial: X-ray diffraction of thin films by Harrington, George F., Santiso, José
Published 2022
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Thickness-dependent microstructural properties of heteroepitaxial (00.1) CuFeO2 thin films on (00.1) sapphire by pulsed laser deposition by Luo, Sijun, Fluri, Aline, Zhang, Song, Liu, Xue, Döbeli, Max, Harrington, George F., Tu, Rong, Pergolesi, Daniele, Ishihara, Tasumi, Lippert, Thomas
Published 2020
Journal Article