Showing 1 - 2 results of 2 for search 'Hertwig Andreas', query time: 0.03s Refine Results
  1. 1
    Hybrid optical measurement technique for detection of defects in epitaxially grown 4H-SiC layers

    Hybrid optical measurement technique for detection of defects in epitaxially grown 4H-SiC layers by Ermilova Elena, Weise Matthias, Hertwig Andreas

    Published 2022-01-01
    Get full text
    Article
  2. 2
    Application of imaging ellipsometry and white light interference microscopy for detection of defects in epitaxially grown 4H–SiC layers

    Application of imaging ellipsometry and white light interference microscopy for detection of defects in epitaxially grown 4H–SiC layers by Ermilova Elena, Weise Matthias, Hertwig Andreas

    Published 2023-01-01
    Get full text
    Article

Search Tools: