Showing 1 - 20 results of 25 for search 'Hetherington, C', query time: 0.04s
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1
The benefits of energy-filtering in weak-beam microscopy by Jenkins, M, Martin, S, Hetherington, C, Kirk, M
Published 2003Conference item -
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Transmission electron microscopy without aberrations: Applications to materials science by Kirkland, A, Chang, L, Haigh, S, Hetherington, C
Published 2008Conference item -
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Materials advances through aberration-corrected electron microscopy by Pennycook, S, Varela, M, Hetherington, C, Kirkland, A
Published 2006Journal article -
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Materials advances through aberration-corrected electron microscopy by Pennycook, S, Varela, M, Hetherington, C, Kirkland, A
Published 2006Journal article -
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Confocal operation of a transmission electron microscope with two aberration correctors by Nellist, P, Behan, G, Kirkland, A, Hetherington, C
Published 2006Journal article -
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The mechanical properties of tungsten grown by chemical vapour deposition by Murphy, J, Giannattasio, A, Yao, Z, Hetherington, C, Nellist, P, Roberts, S
Published 2009Conference item -
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The mechanical properties of tungsten grown by chemical vapour deposition by Murphy, J, Giannattasio, A, Yao, Z, Hetherington, C, Nellist, P, Roberts, S
Published 2009Journal article -
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High resolution imaging using the Oxford aberration corrected TEM by Hetherington, C, Kirkland, A, Doole, R, Cockayne, D, Titchmarsh, J, Hutchison, J
Published 2006Journal article -
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HREM analysis of Sigma 3 {112} boundaries in gold bicrystal films by Hetherington, C, Dahmen, U, Kilaas, R, Kirkland, A, Meyer, R, Medlin, D
Published 2001Conference item -
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Low-dose aberration corrected cryo-electron microscopy of organic specimens. by Evans, J, Hetherington, C, Kirkland, A, Chang, L, Stahlberg, H, Browning, N
Published 2008Journal article -
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Aberration-corrected HREM/STEM for semiconductor research by Hetherington, C, Cockayne, D, Doole, R, Hutchison, J, Kirkland, A, Titchmarsh, J
Published 2005Conference item -
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Microstructural dependence of giant-magnetoresistance in electrodeposited Cu-Co alloys by Cohen-Hyams, T, Plitzko, J, Hetherington, C, Hutchison, J, Yahalom, J, Kaplan, W
Published 2004Journal article -
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Prospective applications for a double-C-s-corrector TEM/STEM by Mobus, G, Titchmarsh, J, Hutchison, J, Hetherington, C, Doole, R, Cockayne, D
Published 2001Conference item -
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Imaging columns of the light elements carbon, nitrogen and oxygen with sub Angstrom resolution. by Kisielowski, C, Hetherington, C, Wang, Y, Kilaas, R, O'Keefe, M, Thust, A
Published 2001Journal article -
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Aberration-corrected imaging of active sites on industrial catalyst nanoparticles. by Gontard, L, Chang, L, Hetherington, C, Kirkland, A, Ozkaya, D, Dunin-Borkowski, R
Published 2007Journal article -
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A versatile double aberration-corrected, energy filtered HREM/STEM for materials science. by Hutchison, J, Titchmarsh, J, Cockayne, D, Doole, R, Hetherington, C, Kirkland, A, Sawada, H
Published 2005Journal article -
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High-resolution TEM and the application of direct and indirect aberration correction. by Hetherington, C, Chang, L, Haigh, S, Nellist, P, Gontard, L, Dunin-Borkowski, R, Kirkland, A
Published 2008Conference item -
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