The benefits of energy-filtering in weak-beam microscopy 由 Jenkins, M, Martin, S, Hetherington, C, Kirk, M

Transmission electron microscopy without aberrations: Applications to materials science 由 Kirkland, A, Chang, L, Haigh, S, Hetherington, C

Materials advances through aberration-corrected electron microscopy 由 Pennycook, S, Varela, M, Hetherington, C, Kirkland, A

Materials advances through aberration-corrected electron microscopy 由 Pennycook, S, Varela, M, Hetherington, C, Kirkland, A

Confocal operation of a transmission electron microscope with two aberration correctors 由 Nellist, P, Behan, G, Kirkland, A, Hetherington, C

The mechanical properties of tungsten grown by chemical vapour deposition 由 Murphy, J, Giannattasio, A, Yao, Z, Hetherington, C, Nellist, P, Roberts, S

The mechanical properties of tungsten grown by chemical vapour deposition 由 Murphy, J, Giannattasio, A, Yao, Z, Hetherington, C, Nellist, P, Roberts, S

Postpartum depression screening in the Neonatal Intensive Care Unit: program development, implementation, and lessons learned 由 Cherry AS, Blucker RT, Thornberry TS, Hetherington C, McCaffree MA, Gillaspy SR

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High resolution imaging using the Oxford aberration corrected TEM 由 Hetherington, C, Kirkland, A, Doole, R, Cockayne, D, Titchmarsh, J, Hutchison, J

HREM analysis of Sigma 3 {112} boundaries in gold bicrystal films 由 Hetherington, C, Dahmen, U, Kilaas, R, Kirkland, A, Meyer, R, Medlin, D

Low-dose aberration corrected cryo-electron microscopy of organic specimens. 由 Evans, J, Hetherington, C, Kirkland, A, Chang, L, Stahlberg, H, Browning, N

Aberration-corrected HREM/STEM for semiconductor research 由 Hetherington, C, Cockayne, D, Doole, R, Hutchison, J, Kirkland, A, Titchmarsh, J

Microstructural dependence of giant-magnetoresistance in electrodeposited Cu-Co alloys 由 Cohen-Hyams, T, Plitzko, J, Hetherington, C, Hutchison, J, Yahalom, J, Kaplan, W

Prospective applications for a double-C-s-corrector TEM/STEM 由 Mobus, G, Titchmarsh, J, Hutchison, J, Hetherington, C, Doole, R, Cockayne, D

Imaging columns of the light elements carbon, nitrogen and oxygen with sub Angstrom resolution. 由 Kisielowski, C, Hetherington, C, Wang, Y, Kilaas, R, O'Keefe, M, Thust, A

Aberration-corrected imaging of active sites on industrial catalyst nanoparticles. 由 Gontard, L, Chang, L, Hetherington, C, Kirkland, A, Ozkaya, D, Dunin-Borkowski, R

The application of spherical aberration correction and focal series restoration to high-resolution images of platinum nanocatalyst particles 由 Gontard, L, Chang, L, Dunin-Borkowski, R, Kirkland, A, Hetherington, C, Ozkaya, D

A versatile double aberration-corrected, energy filtered HREM/STEM for materials science. 由 Hutchison, J, Titchmarsh, J, Cockayne, D, Doole, R, Hetherington, C, Kirkland, A, Sawada, H

High-resolution TEM and the application of direct and indirect aberration correction. 由 Hetherington, C, Chang, L, Haigh, S, Nellist, P, Gontard, L, Dunin-Borkowski, R, Kirkland, A

Carbon micro- and nanotubes synthesized by PE-CVD technique: Tube structure and catalytic particles crystallography 由 Kiselev, N, Hutchison, J, Moravsky, A, Rakova, E, Dreval, E, Hetherington, C, Zakharov, D, Sloan, J, Loutfy, R