Determination of layer morphology of rough layers in organic light emitting diodes by X‐ray reflectivity by Ian Sachs, Marc Fuhrmann, Wim Deferme, Hildegard Möbius

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Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy by Alexander Krivcov, Jasmin Ehrler, Marc Fuhrmann, Tanja Junkers, Hildegard Möbius

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Magnetic Imaging of Encapsulated Superparamagnetic Nanoparticles by Data Fusion of Magnetic Force Microscopy and Atomic Force Microscopy Signals for Correction of Topographic Cross... by Marc Fuhrmann, Anna Musyanovych, Ronald Thoelen, Sibylle von Bomhard, Hildegard Möbius

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