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    Characterization of Defect Traps in SiO2 Thin Films

    Characterization of Defect Traps in SiO2 Thin Films by Jean-Yves Rosaye, Pierre Mialhe, Jean-Pierre Charles, Mitsuo Sakashita, Hiroya Ikeda, Akira Sakai, Shigeaki Zaima, Yukio Yasuda

    Published 2001-01-01
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