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Capacitive Measurements of SiO<sub>2</sub> Films of Different Thicknesses Using a MOSFET-Based SPM Probe by Hoontaek Lee, Kumjae Shin, Wonkyu Moon
Published 2021-06-01
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Improving the Performance of the ToGoFET Probe: Advances in Design, Fabrication, and Signal Processing by Hoontaek Lee, Junsoo Kim, Kumjae Shin, Wonkyu Moon
Published 2021-10-01
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