Atomic partial wave meter by attosecond coincidence metrology by Wenyu Jiang, Gregory S. J. Armstrong, Jihong Tong, Yidan Xu, Zitan Zuo, Junjie Qiang, Peifen Lu, Daniel D. A. Clarke, Jakub Benda, Avner Fleischer, Hongcheng Ni, Kiyoshi Ueda, Hugo W. van der Hart, Andrew C. Brown, Xiaochun Gong, Jian Wu

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