Influence of the nanoparticles agglomeration state in the quantum-confinement effects: Experimental evidences by I. Lorite, J. J. Romero, J. F. Fernandez

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In situ thermal runaway of Si-based press-fit diodes monitored by infrared thermography by A. Moure, S. Román-Sánchez, A. Serrano, I. Lorite, J.F. Fernández

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Thermal response of active Si in press-fit rectifier diodes by confocal Raman microscopy: Influence of diode design and technology by S. Román-Sánchez, A. Serrano, A. del Campo, I. Lorite, J.F. Fernández, A. Moure

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Improving the reliability of silicon diodes via manufacturing process modification strategies by S. Román-Sánchez, M. París Ogáyar, I. Lorite, J.F. Fernández, A. Serrano, A. Moure

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