Suppressing Undesired Channel Length‐Dependent Electrical Characteristics of Fully Integrated InGaZnO Thin‐Film Transistors via Defect Control Layer by Kyung Min Kim, Jeong Suk Yang, Hyung Tae Kim, Inhyo Han, Sang‐Hoon Jung, Joon‐Young Yang, Yong Min Ha, Soo Young Yoon, Hyun Jae Kim

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