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International Conference on Advanced Measurement and Test (2010 : Sanya Shi, China)
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Progress in measurement and testing : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R...
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International Conference on Advanced Measurement and Test (2010 : Sanya Shi, China
)
,
Wu, Yanwen
Published c201
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