Showing 1 - 16 results of 16 for search 'J. Edelstein', query time: 0.04s
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Optical Design of the far Ultraviolet Imaging Spectrograph by K. S. Ryu, K. I. Seon, K. W. Min, J. Edelstein
Published 1998-12-01
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Identification of a pre-active conformation of a pentameric channel receptor by Anaïs Menny, Solène N Lefebvre, Philipp AM Schmidpeter, Emmanuelle Drège, Zaineb Fourati, Marc Delarue, Stuart J Edelstein, Crina M Nimigean, Delphine Joseph, Pierre-Jean Corringer
Published 2017-03-01
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On VI Emission Line Detection Limit of Far-Ultraviolet Imaging Spectrograph by K.-I. Seon, K.-S. Ryu, I.-S. Yuk, J.-H. Park, U.-W. Nam, W. Han, J.-H. Seon, K.-W. Min, J. Edelstein, E. J. Korpela
Published 2000-06-01
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Tolerance Analysis of FIMS Optical System by K.-S. Ryu, K.-I. Seon, I.-S. Yuk, J.-H. Seon, U.-W. Nam, D.-H. Lee, K.-W. Min, W. Han, J. Edelstein, E. J. Korpela
Published 2000-06-01
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Thermal and Structural Analysis of FIMS Grating by K.-I. Seon, I.-S. Yuk, K.-S. Ryu, J.-H. Park, K. Kang, H. Jin, U.-W. Nam, W. Han, K.-W. Min, W.-B. Lee, J. Edelstein, E. Korpela
Published 2001-06-01
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Sensitivity Calibration of Far-Ultraviolet Imaging Spectrograph by I. -J. Kim, K. -I. Seon, I.-S. Yuk, U.-W. Nam, H. Jin, J.-H. Park, K.-S. Ryu, D.-H. Lee, W. Han, K.-W. Min, J. Edelstein, E. Korpela
Published 2004-12-01
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Attitude and Exposure Corrections of FIMS Data by K.-I. Seon, I.-S. Yuk, K.-S. Ryu, D.-H. Lee, J.-H. Park, H. Jin, J.-H. Shinn, U.-W. Nam, W. Han, K. Min, E. Korpela, K. Nishikida, J. Edelstein
Published 2004-12-01
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Exposure Time Analysis for Far-Ultraviolet Imaging Spectrograph All-Sky Survey Mission by J.-H. Park, K.-I. Seon, K.-S. Ryu, I.-S. Yuk, H. Jin, D.-H. Lee, S.-H. Oh, J. Seon, U.-W. Nam, W. Han, W.-B. Lee, K.-W, Min, J. Edelstein, E. J. Korpela
Published 2001-12-01
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Thermal Analysis of FIMS TDC and LVPS Electronic Boards by K.-I. Seon, I.-S. Yuk, U.-W. Nam, H. Jin, J.-H. Park, J.-G. Rhee, K.-S. Ryu, D.-H. Lee, H.-S. Oh, K.-K. Kong, W. Han, K.-W. Min, J. Edelstein, E. Korpela
Published 2002-12-01
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Error Budget Analysis of FIMS Optical System by K.-I. Seon, I.-S. Yuk, K.-S. Ryu, J.-H. Park, H. Jin, J.-H. Seon, S.-H. Oh, J.-G. Rhee, D.-H. Lee, U.-W. Nam, W. Han, K.-W, Min, W.-B. Lee, J. Edelstein, E. Korpela
Published 2001-12-01
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Performance of FIMS Microchannel Plate Detector System by U. W. Nam, J. G. Rhee, K. N. Kong, Y. S. Park, K. C. Jin, H. Jin, J. -H. Park, I. S. Yuk, K. I. Seon, W. Han, D. H. Lee, K. S. Ryu, K. W. Min, J. Edelstein, E. Korpela
Published 2002-12-01
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Manufacturing and Test Results of Off-Axis Parabolic Cylinder Mirror for FIMS by K.-S. Ryu, I.-S. Yuk, K.-I. Seon, Y.-W. Lee, U.-W. Nam, J.-H. Shin, S.-J. Hong, D.-H. Lee, H. Jin, S.-H. Oh, J.-G. Rhee, K.-W, Min, W. Han, J.-H. Park, J. Edelstein, E. J. Korpela
Published 2001-12-01
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High Resolution Delay Line Readout Electronics for the FIMS 2-D Position Sensitive Detector by J. G. Rhee, U. W. Nam, K. N. Kong, D. H. Lee, J. H. Shin, I. S. Yuk, H. Jin, K. S. Ryu, K. I. Seon, K. I. Kang, J. H. Park, K. W. Min, W. Y. Han, W. B. Lee, E. korpela, J. Edelstein
Published 2002-03-01
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