Showing 1 - 7 results of 7 for search 'J. Hagmann', query time: 0.03s
Refine Results
-
1
-
2
-
3
Scanning frequency comb microscopy—A new method in scanning probe microscopy by M. J. Hagmann
Published 2018-12-01
Article -
4
-
5
Simulation of sub-nm carrier profiling by scanning frequency comb microscopy by M. J. Hagmann, J. Wiedemeier
Published 2019-05-01
Article -
6
-
7