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    The investigation of ferromagnetic resonance linewidth in Ni80Fe20 films with submicron rectangular elements

    The investigation of ferromagnetic resonance linewidth in Ni80Fe20 films with submicron rectangular elements by D. Zhang, J. J. Yue, Z. X. Kou, L. Lin, Y. Zhai, H. R. Zhai

    Published 2016-05-01
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