Crystalline or amorphous? A critical evaluation of phenomenological phase selection rules by K. Wieczerzak, A. Sharma, C. Hain, J. Michler

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Novel micro-scale specimens for mode-dependent fracture testing of brittle materials: A case study on GaAs single crystals by J. Ast, J.J. Schwiedrzik, N. Rohbeck, X. Maeder, J. Michler

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An exploratory study on strengthening and thermal stability of magnetron sputtered W nanoparticles at the interface of Cu/Ni multilayer films by R.L. Schoeppner, G. Mohanty, M.N. Polyakov, L. Petho, X. Maeder, J. Michler

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Ultrastrong nanocrystalline binary alloys discovered via high-throughput screening of the CoCr system by K. Wieczerzak, O. Nowicka, S. Michalski, T.E.J. Edwards, M. Jain, T. Xie, L. Pethö, X. Maeder, J. Michler

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High-entropy transition metal nitride thin films alloyed with Al: Microstructure, phase composition and mechanical properties by A.V. Pshyk, A. Vasylenko, B. Bakhit, L. Hultman, P. Schweizer, T.E.J. Edwards, J. Michler, G. Greczynski

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High-power-density sputtering of industrial-scale targets: Case study of (Al,Cr)N by F.F. Klimashin, J. Klusoň, M. Učík, R. Žemlička, M. Jílek, A. Lümkemann, J. Michler, T.E.J. Edwards

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3D printed microchannels for sub-nL NMR spectroscopy. by E Montinaro, M Grisi, M C Letizia, L Pethö, M A M Gijs, R Guidetti, J Michler, J Brugger, G Boero

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Fracture properties of thin film TiN at elevated temperatures by J. Buchinger, L. Löfler, J. Ast, A. Wagner, Z. Chen, J. Michler, Z.L. Zhang, P.H. Mayrhofer, D. Holec, M. Bartosik

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Structural characterisation of Cu-Zr thin film combinatorial libraries with synchrotron radiation at the limit of crystallinity by B. Putz, O. Milkovič, G. Mohanty, R. Ipach, L. Pethö, J. Milkovičová, X. Maeder, T.E.J. Edwards, P. Schweizer, M. Coduri, K. Saksl, J. Michler

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Metastable phase formation of (Mo,Cr)2AlB2 MAB phase thin films revealed by theory and experiments by P. J. Pöllmann, D. Bogdanovski, S. Lellig, P. Schweizer, M. Hans, C. Azina, S. Karimi Aghda, P. Zöll, D. M. Holzapfel, D. Primetzhofer, S. Kolozsvári, P. Polcik, J. Michler, J. M. Schneider

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